Title of article
Optical and structural properties of two-sourced evaporated ZnTe thin films
Author/Authors
Akram K.S. Aqili، نويسنده , , Zulfiqar Ali، نويسنده , , Asghari Maqsood)، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
11
From page
1
To page
11
Abstract
Optical properties of ZnTe films, deposited by thermal evaporation of Zn and Te sources, were studied in the range of
400–2000 nm by UV–VIS–NIR spectrophotometer. Variations of refractive index with incident photon energy are fitted to
a single oscillator model. Optical band gap and X-ray diffraction XRD.have been reported for ZnTe films formed at
substrate temperature of 3008C with different evaporation rates. q2000 Elsevier Science B.V. All rights reserved.
Keywords
refractive index , ZnTe thin film , Source temperature
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996567
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