Title of article :
Optical and morphological properties of
laser photo-deposited hydrogenated CNx thin ®lms
Author/Authors :
A. Crunteanu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
The optical and morphological properties of hydrogenated carbon nitride thin ®lms obtained by ArF excimer laser photodeposition
(l 193 nm) from different ammonia/acetylene mixtures were investigated. The optical properties of the ®lms
depend on the nitrogen content. The band gap deduced from measurements of the optical absorption coef®cient in the UV±
VIS spectrum is found to be superior to 2.3 eV. Film thicknesses and refraction indexes were investigated by m-lines
spectroscopy. The refraction index varies from 1.66 to 1.72. The microstructure of the deposited ®lms as revealed by scanning
and transmission electron microscopy is discussed as a function of the deposition parameters. # 2000 Elsevier Science B.V.
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Keywords :
TEM , UV±VIS spectroscopy , m-lines spectroscopy , SEM , Carbon nitride , Laser CVD
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science