Title of article
Growth and characterization of ZnO thin ®lms grown by pulsed laser deposition
Author/Authors
Sang Hyuck Bae، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
4
From page
525
To page
528
Abstract
ZnO thin ®lms on (0 0 1) sapphire substrates have been deposited by pulsed laser deposition technique using a Nd:YAG
laser with the wavelength of 355 nm at an oxygen pressure of 350 mTorr. In order to investigate the effect of the deposition
conditions on the properties of ZnO thin ®lms, the experiment has been performed at various substrate temperatures in the
range of 200±7008C. According to XRD, (0 0 2) textured ZnO ®lms of high crystalline quality have been obtained by pulsed
laser deposition technique. However, the intensity of UV emission is mostly dependent upon the stoichiometry of ZnO ®lms,
rather than the crystalline quality. # 2001 Elsevier Science B.V. All rights reserved
Keywords
ZNO , XRD , UV emission , PL , Hall measurement , PLD
Journal title
Applied Surface Science
Serial Year
2001
Journal title
Applied Surface Science
Record number
996780
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