Title of article :
Growth and characterization of ZnO thin ®lms grown by pulsed laser deposition
Author/Authors :
Sang Hyuck Bae، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
4
From page :
525
To page :
528
Abstract :
ZnO thin ®lms on (0 0 1) sapphire substrates have been deposited by pulsed laser deposition technique using a Nd:YAG laser with the wavelength of 355 nm at an oxygen pressure of 350 mTorr. In order to investigate the effect of the deposition conditions on the properties of ZnO thin ®lms, the experiment has been performed at various substrate temperatures in the range of 200±7008C. According to XRD, (0 0 2) textured ZnO ®lms of high crystalline quality have been obtained by pulsed laser deposition technique. However, the intensity of UV emission is mostly dependent upon the stoichiometry of ZnO ®lms, rather than the crystalline quality. # 2001 Elsevier Science B.V. All rights reserved
Keywords :
ZNO , XRD , UV emission , PL , Hall measurement , PLD
Journal title :
Applied Surface Science
Serial Year :
2001
Journal title :
Applied Surface Science
Record number :
996780
Link To Document :
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