Title of article :
Studies on reactive sputtering process of TiN ®lms using small mass analyzers
Author/Authors :
Tatsuya Banno، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
6
From page :
757
To page :
762
Abstract :
Investigation on the reactive sputtering plasma process for the TiN ®lms has been carried out, using small mass analyzers located in a discharge vessel without differential pumping units. A reaction mechanism is studied on time-dependent data of the transition of a Ti-target surface from nitride to the metallic state. The ¯ux of ionic species from the plasma has been measured as well, and is discussed in association with the electric potential formation. # 2001 Elsevier Science B.V. All rights reserved
Keywords :
Mass analysis in plasma , Surface reaction , Ion-induced release , First-order kinetics , TIN
Journal title :
Applied Surface Science
Serial Year :
2001
Journal title :
Applied Surface Science
Record number :
996826
Link To Document :
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