Title of article
Lattice constant determination from Kossel patterns observed by CCD camera
Author/Authors
E Langer، نويسنده , , S D?britz، نويسنده , , C Schurig، نويسنده , , W Hauffe، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
4
From page
45
To page
48
Abstract
The Kossel technique is known due to its precision for lattice constant determination in micro ranges by use of X-ray films. Recently we observed the Kossel interferences also by a CCD camera in a good quality. Thus, the diffraction interferences could be immediately processed and evaluated by computer permitting considerable time saving. In order to obtain the similar accuracy as for measurements with X-ray films further technical and experimental improvements were necessary, especially for a better contrast to observe intersection points of several weak reflections, for evaluating digital patterns, for optimizing of the shortest focus-screen distance and for considering the image field curvature of the objective. As a result, a precision in lattice constant determination could be achieved at a Fe-crystal coming relatively close to the one of comparable X-ray film patterns, which is still about one order of magnitude better for the time being.
Keywords
Fe , CCD camera , Lattice source interferences , Kossel technique , Lattice constant
Journal title
Applied Surface Science
Serial Year
2001
Journal title
Applied Surface Science
Record number
997204
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