Author/Authors :
J. Daillant، نويسنده , , S. Mora، نويسنده , , C. Fradin، نويسنده , , M. Alba، نويسنده , , A. Braslau، نويسنده , , D. Luzet، نويسنده ,
Abstract :
X-ray scattering techniques are increasingly used for the study of liquid surfaces and interfaces. We give here scattering cross-sections for diffraction or diffuse scattering from liquid interfaces and we discuss the examples of the liquid–vapour interface and of films at a liquid–liquid interface. We show that the interfacial structure can be understood as resulting of the interplay between thermal fluctuations, van der Waals forces, and elastic properties.