Title of article :
Structure and fluctuations of liquid surfaces and interfaces
Author/Authors :
J. Daillant، نويسنده , , S. Mora، نويسنده , , C. Fradin، نويسنده , , M. Alba، نويسنده , , A. Braslau، نويسنده , , D. Luzet، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
8
From page :
223
To page :
230
Abstract :
X-ray scattering techniques are increasingly used for the study of liquid surfaces and interfaces. We give here scattering cross-sections for diffraction or diffuse scattering from liquid interfaces and we discuss the examples of the liquid–vapour interface and of films at a liquid–liquid interface. We show that the interfacial structure can be understood as resulting of the interplay between thermal fluctuations, van der Waals forces, and elastic properties.
Keywords :
Liquid surfaces and interfaces , Fluctuations , Interfacial structure
Journal title :
Applied Surface Science
Serial Year :
2001
Journal title :
Applied Surface Science
Record number :
997350
Link To Document :
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