Title of article :
Double-peak distribution of electron and ion emission profile during femtosecond laser ablation of metals
Author/Authors :
S. Amoruso، نويسنده , , X. Wang، نويسنده , , C. Altucci، نويسنده , , C. de Lisio، نويسنده , , Piero M. Armenante، نويسنده , , R. Bruzzese، نويسنده , , N. Spinelli، نويسنده , , R. Velotta، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
6
From page :
358
To page :
363
Abstract :
Femtosecond laser ablation of metals with a Ti:sapphire laser system has been investigated by a time-of-flight mass spectroscopy technique. Ion mass spectra show a double-peak distribution, evidencing the presence of a high-energy component (up to few keV), even at moderate laser intensities (1012–1013 W cm−2). Two different ablation regimes were identified for the less energetic component, and explained in the framework of the two-temperature modeling of ultrashort laser pulse–solid target interactions. Ambipolar diffusion has been identified as the probable mechanism giving rise to the observed high-energy plasma plume component.
Keywords :
Ultrashort laser ablation , Time-of-flight technique
Journal title :
Applied Surface Science
Serial Year :
2002
Journal title :
Applied Surface Science
Record number :
997605
Link To Document :
بازگشت