• Title of article

    Adhesion of neural cells on silicon wafer with nano-topographic surface

  • Author/Authors

    Y.W Fan، نويسنده , , F.Z. Cui، نويسنده , , L.N Chen، نويسنده , , Y Zhai، نويسنده , , Q.Y Xu، نويسنده , , I-S Lee، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    6
  • From page
    313
  • To page
    318
  • Abstract
    The adherence and subsequent viability of central neural cells (substantia nigra) on silicon wafers with different surface roughness conditions were investigated. Various roughness conditions of the silicon wafer were achieved by etching at different times. The topography was evaluated by AFM. Primary neurons were obtained from Wistar rats. The adherence and subsequent viability of the cells on the wafer were examined by scanning electronic microscopy and fluorescence immunostaining of tyrosine hydroxylase. It is found that the surface roughness affects significantly cell adhesion and viability. Cells can survive for over 5 days on the surface with average roughness in the range 20–70 nm. Such a treatment may provide a new method to make a mild interface of silicon-based electronic devices and neurons as well as other living tissues.
  • Keywords
    Silicon , Roughness , Cell adherence , Neuron
  • Journal title
    Applied Surface Science
  • Serial Year
    2002
  • Journal title
    Applied Surface Science
  • Record number

    997686