Microstructural analysis of AU/NI multilayers interfaces by SAXS and STM

We have investigated the interface roughness in Au/Ni multilayers by scanning tunnelling microscopy (STM) and small angles X-ray scattering. The comparison of the roughness statistical parameters deduced from these two techniques is reported. A good agreement is found for the ξ values but not for the h values. A linear relationship between ξ and the grain size has been evidenced from STM images and numerical simulations.