• Title of article

    In situ measurements of As/P exchange during InAs/InP(0 0 1) quantum wires growth

  • Author/Authors

    M.U. Gonz?lez، نويسنده , , J.M. Garc??a، نويسنده , , L. Gonz?lez، نويسنده , , J.P. Silveira، نويسنده , , Y. Gonz?lez، نويسنده , , J.D. G?mez، نويسنده , , F. Briones، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    5
  • From page
    188
  • To page
    192
  • Abstract
    Unintentional As/P exchange has a significant influence on InAs/InP nanostructures growth. In this paper, we report on the As/P exchange reactions at different temperatures studied by in situ stress measurements and reflectance difference (RD) characterization. When arsenic atoms are incorporated at the InP surface, an asymmetric stress is built up that is responsible for quantum wires (QWr) formation. We obtain that arsenic atoms do not actively displace phosphorous from the surface at the range of surface temperatures and exposure times of interest for growth of InAs nanostructures by molecular beam epitaxy (MBE). Instead, the arsenic atoms bind to available In atoms left vacant by phosphorous desorption at the corresponding temperature.
  • Keywords
    In situ stress measurements , As/P exchange , Heteroepitaxy , Molecular beam epitaxy , Nanostructures
  • Journal title
    Applied Surface Science
  • Serial Year
    2002
  • Journal title
    Applied Surface Science
  • Record number

    997719