Title of article
In situ measurements of As/P exchange during InAs/InP(0 0 1) quantum wires growth
Author/Authors
M.U. Gonz?lez، نويسنده , , J.M. Garc??a، نويسنده , , L. Gonz?lez، نويسنده , , J.P. Silveira، نويسنده , , Y. Gonz?lez، نويسنده , , J.D. G?mez، نويسنده , , F. Briones، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
5
From page
188
To page
192
Abstract
Unintentional As/P exchange has a significant influence on InAs/InP nanostructures growth. In this paper, we report on the As/P exchange reactions at different temperatures studied by in situ stress measurements and reflectance difference (RD) characterization. When arsenic atoms are incorporated at the InP surface, an asymmetric stress is built up that is responsible for quantum wires (QWr) formation. We obtain that arsenic atoms do not actively displace phosphorous from the surface at the range of surface temperatures and exposure times of interest for growth of InAs nanostructures by molecular beam epitaxy (MBE). Instead, the arsenic atoms bind to available In atoms left vacant by phosphorous desorption at the corresponding temperature.
Keywords
In situ stress measurements , As/P exchange , Heteroepitaxy , Molecular beam epitaxy , Nanostructures
Journal title
Applied Surface Science
Serial Year
2002
Journal title
Applied Surface Science
Record number
997719
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