Title of article :
Observation of Si(1 0 0) surface with noncontact atomic force microscope at 5 K
Author/Authors :
T. Uozumi، نويسنده , , Y. Tomiyoshi، نويسنده , , N. Suehira، نويسنده , , Y. Sugawara، نويسنده , , S. MORITA، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Abstract :
We observed atomic resolution images of the Si(1 0 0) surface at 5 K using low-temperature noncontact atomic force microscope (LT-NC-AFM). Si(1 0 0) surface shows almost the asymmetric dimers structure, except for the symmetric dimers structure near the defects. The asymmetric dimers are mainly c(4×2) structure with antiparallel zigzag pattern and partly p(2×2) structure with parallel zigzag pattern.
Keywords :
Low temperature atomic force microscope , Noncontact atomic force microscope , Si(1 0 0) , Frequency modulation technique
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science