Title of article
Observation of Si(1 0 0) surface with noncontact atomic force microscope at 5 K
Author/Authors
T. Uozumi، نويسنده , , Y. Tomiyoshi، نويسنده , , N. Suehira، نويسنده , , Y. Sugawara، نويسنده , , S. MORITA، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
6
From page
279
To page
284
Abstract
We observed atomic resolution images of the Si(1 0 0) surface at 5 K using low-temperature noncontact atomic force microscope (LT-NC-AFM). Si(1 0 0) surface shows almost the asymmetric dimers structure, except for the symmetric dimers structure near the defects. The asymmetric dimers are mainly c(4×2) structure with antiparallel zigzag pattern and partly p(2×2) structure with parallel zigzag pattern.
Keywords
Low temperature atomic force microscope , Noncontact atomic force microscope , Si(1 0 0) , Frequency modulation technique
Journal title
Applied Surface Science
Serial Year
2002
Journal title
Applied Surface Science
Record number
997731
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