Title of article :
Dynamic AFM using the FM technique with constant excitation amplitude
Author/Authors :
B. Gotsmann )، نويسنده , , H. Fuchs، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Abstract :
Dynamic atomic force microscopy using the frequency modulation technique is investigated for the case that the excitation amplitude is kept constant. This mode of operation has very unique properties. A computer simulation is used to investigate the distance dependence of the measurement signals frequency and amplitude using various conservative and non-conservative interaction forces. It is shown how the two measurement channels are interlinked and influenced by both conservative and dissipative interactions. Further, discontinuous frequency shift versus distance curves as reported in the literature were not obtained.
Keywords :
Constant excitation , AFM , Dynamic force spectroscopy , Frequency modulation
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science