Title of article
In-phase step wandering on vicinal Si(1 1 1) surfaces
Author/Authors
Akiko Natori، نويسنده , , Nobuo Suga، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
7
From page
96
To page
102
Abstract
The step structure transition between a regular step and a bunched step on vicinal Si(1 1 1) surfaces induced by DC is studied by the kinetic Monte Carlo simulation in a terrace-adatom-step-kink (TASK) model. In the TASK model, effective force due to DC is taken into account explicitly on the mass transport of Si adatoms. In the diffusion-limited regime corresponding to the experimental temperature range II, step bunching is induced by step-up force and in-phase wandering of a regular step is formed by step-down force. The in-phase wandering of a regular step is formed by nucleation growth mode and the amplitude of wandering grows with time in proportion to t. The period of in-phase wandering decreases as the effective force increases, consistent with the recent experimental results.
Keywords
Step bunching , Step kinetics , Step wandering , Electromigration , Si(1 1 1)
Journal title
Applied Surface Science
Serial Year
2002
Journal title
Applied Surface Science
Record number
997840
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