Title of article :
Interaction of metals with an organic semiconductor: Ag and In on PTCDA
Author/Authors :
S. Park، نويسنده , , T.U. Kampen and K. Horn، نويسنده , , T. Kachel، نويسنده , , P. Bressler، نويسنده , , W. Braun، نويسنده , , D.R.T. Zahn، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
6
From page :
376
To page :
381
Abstract :
The interaction of Ag and In with a thin film of 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA) was studied by near-edge X-ray absorption fine structure (NEXAFS). Upon Ag deposition on a PTCDA film of 20 nm thickness the relative intensities and lineshapes, as well as the angular dependence of the spectra remains unchanged, illustrating the formation of a chemically unreactive Ag/PTCDA interface. On the other hand, the adsorption of 0.3 nm In strongly decreases the intensity of the π∗ resonances in C and O K-edge NEXAFS spectra. This is attributed to a strong charge transfer between In and PTCDA, leading to a redistribution of the charge in the molecule. However, the absence of a strong shift or new features and negligible dependence of peak intensities corresponding to π∗ resonances on the In thickness indicate that the interaction between In and PTCDA is not accompanied by a covalent bond formation.
Keywords :
NEXAFS , PTCDA , In and Ag , Interface interaction
Journal title :
Applied Surface Science
Serial Year :
2002
Journal title :
Applied Surface Science
Record number :
997893
Link To Document :
بازگشت