• Title of article

    Highly stable passivation of a Si(1 1 1) surface using bilayer-GaSe

  • Author/Authors

    K. Ueno، نويسنده , , H. Shirota، نويسنده , , T. Kawamura، نويسنده , , T. Shimada، نويسنده , , K. Saiki، نويسنده , , A. Koma and N.S. Sokolov، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    6
  • From page
    485
  • To page
    490
  • Abstract
    As a stable and ‘epitaxial’ passivation of a Si surface, we propose the bilayer-GaSe termination of a Si(1 1 1) surface. This surface is fabricated by depositing one monolayer of Ga on a clean Si(1 1 1) surface and subsequent annealing in a Se flux at around 520 °C, which results in unreconstructed 1×1 termination of the Si(1 1 1) surface by bilayer-GaSe. We found by scanning tunneling microscopy observation that slow cooling of the clean Si(1 1 1) surface from 850 to 520 °C with simultaneous deposition of a Ga flux results in better termination of the Si(1 1 1) surface. It was also found that this surface is stable against heating around 400 °C in O2 atmosphere of 3×10−3 Pa. By utilizing these properties of the bilayer-GaSe terminated surface, we have succeeded in fabricating ZnO quantum dots on this substrate.
  • Keywords
    GaSe , Si , Bilayer-GaSe , Dangling bond termination , ZnO , Quantum dot , Surface passivation
  • Journal title
    Applied Surface Science
  • Serial Year
    2002
  • Journal title
    Applied Surface Science
  • Record number

    997912