Title of article
Investigation of spatial distribution of defects in ultra-fine grained copper
Author/Authors
Jakub ????ek، نويسنده , , Ivan Proch?zka، نويسنده , , Oksana Melikhova، نويسنده , , Gerhard Brauer، نويسنده , , Wolfgang Anwand، نويسنده , , Radom??r Ku?el، نويسنده , , Miroslav Cieslar، نويسنده , , Rinat K Islamgaliev، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
5
From page
140
To page
144
Abstract
Ultra-fine grained copper prepared by high pressure torsion has been studied by means of slow positron implantation spectroscopy with Doppler broadening measurement. In addition, conventional positron lifetime and Doppler broadening spectroscopy have been utilised. Defects present in the specimens were identified, their spatial distribution and depth profile have been determined. The results are discussed in correlation with those obtained by XRD and TEM.
Keywords
Microvoid , Dislocation , Positron annihilation , Ultra-fine grained metal
Journal title
Applied Surface Science
Serial Year
2002
Journal title
Applied Surface Science
Record number
998043
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