• Title of article

    Critical issues in enhancing brightness in thin film phosphors for flat-panel display applications

  • Author/Authors

    R.K Singh، نويسنده , , Z Chen، نويسنده , , D Kumar، نويسنده , , K Cho، نويسنده , , M Ollinger، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    4
  • From page
    321
  • To page
    324
  • Abstract
    Thin film phosphors have potential applications in field emission flat-panel displays. However, they are limited by the lower cathodoluminescent brightness in comparison to phosphor powders. In this paper, we have investigated the critical parameters that need to be optimized to increase the brightness of phosphor thin films. Specifically, we studied the role of surface roughness and optical properties of the substrate on the brightness of the phosphor films. Thin Y2O3:Eu phosphor films were deposited on various substrates (lanthanum aluminate, quartz, sapphire, and silicon) with thicknesses varying from 50 to 500 nm. A model that accounts for diffuse and specular or scattering effects has been developed to understand the effects of the microstructure on the emission characteristics of the cathodoluminescent films. The results from the model show that both the optical properties of the substrate and the surface roughness of the films play a critical role in controlling the brightness of laser deposited phosphor films.
  • Keywords
    Europium-doped yttrium oxide , Field emission displays , Surface roughness , Thin film phosphors
  • Journal title
    Applied Surface Science
  • Serial Year
    2002
  • Journal title
    Applied Surface Science
  • Record number

    998210