Author/Authors :
Feng Chen، نويسنده , , Qing-Ming Lu، نويسنده , , Xue-Lin Wang، نويسنده , , Jian-Hua Zhang، نويسنده , , Fei Lu، نويسنده , , Bo-Rong Shi، نويسنده , , Ke-Ming Wang، نويسنده , , Ding-Yu Shen، نويسنده , , Hong-Ji Ma and Rui Nie، نويسنده ,
Abstract :
The 2.8 MeV Ni+ ion-implanted planar optical waveguide in Nd:YVO4 crystal is reported. The prism coupling method is used to measure the dark modes of the Nd:YVO4 waveguide. It is found that the effective refractive indices of all the extraordinary modes are lower than that of the substrate (ne), while the effective indices of the first three ordinary modes have a positive change compared with that of the substrate (no). Both ne and no profiles in the waveguide are reconstructed by reflectivity calculation method (RCM).
Keywords :
Planar waveguide , Refractive index profile , Ion implantation , Waveguide laser , Nd:YVO4
