X-ray photoelectron spectroscopy studies of Ag-doped thin amorphous GexSb40−xS60 films

X-ray photoelectron spectroscopy has been used to determine the binding energies of the core electrons in Ag-doped amorphous thin GexSb40−xS60 films (x=15, 20, 25 and 27). Chemical shifts of the constituent elements have revealed that electrons are transferred from chalcogenide to metal and compounds such as Ag2S and Ag2O are likely to form due to photo-induced chemical modification and oxidation, respectively. Charge defects are induced in the amorphous system.