Title of article
Miscut angles measurement and precise sample positioning with a four circle diffractometer
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
6
From page
322
To page
327
Abstract
A method is derived for precise sample positioning with a four circle diffractometer. The sample can be oriented either with respect to a crystallographic plane or with respect to the sample surface with an accuracy of about 0.001°. The miscut angles can be easily deduced with an accuracy of a few 1/1000°.
Keywords
Miscut , X-ray diffraction , Substrates
Journal title
Applied Surface Science
Serial Year
2001
Journal title
Applied Surface Science
Record number
998535
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