Title of article
Structural and optical characterization of Zn doped CdSe films
Author/Authors
G. Perna، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
7
From page
366
To page
372
Abstract
Undoped CdSe and CdSe:Zn thin films have been grown on silicon substrate by using pulsed laser deposition technique. The
electrical, structural and optical properties have been investigated. The films grow crystalline and highly oriented. Electrical
measurements show that they are n-type doped. The reflectivity and photoluminescence are consistent and point out that the
undoped CdSe film present excitonic features at low temperature, differently from CdSe:Zn films, whose spectral features are
related to band–band transition. The luminescence efficiency of CdSe:Zn persists up to room temperature, whereas the
luminescence of undoped CdSe is scarcely visible above 250 K.
# 2004 Elsevier B.V. All rights reserved.
Keywords
CdSe , thin films , Laser ablation , Optical characterization
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
998681
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