Title of article
Inhomogeneous broadening arising from interface fluctuations in strained InxGa1 xAs/GaAs and (InuGa1 uAs)v(InP)1 v/InP quantum wells
Author/Authors
C.L.N. Oliveira، نويسنده , , J.A.K. Freire، نويسنده , , V.N. Freire، نويسنده , , G.A. Farias، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
7
From page
38
To page
44
Abstract
The effects of inhomogeneous broadening in strained InxGa1 xAs/GaAs and (InuGa1 uAs)v (InP)1 v/InP quantum wells is
studied. A theoretical model is proposed to describe the interface broadening, where the strain effects are considered by
assuming a gradual interface between the different alloys. In these interfaces, we take into account the fluctuations of their
thickness and position with respect to the abrupt interface picture. We build the confinement potential in the quantum well
considering the effects of non-abrupt interface and we calculate the shift on the confined exciton spectra by using two numerical
approaches, the effective potential and variational method. Our numerical results allows us to evaluate energies differences for
the ground state of excitons higher than 49 meV, which is related to interfacial fluctuations in 50 A ° QWs, when compared with
abrupt interface calculations.
# 2004 Elsevier B.V. All rights reserved
Keywords
exciton , Gradual interfaces
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
998693
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