Title of article
Structural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction
Author/Authors
T. Aoyama ، نويسنده , , K. Akimoto *، نويسنده , , A. Ichimiya، نويسنده , , Y. Hisada ، نويسنده , , S. Mukainakano، نويسنده , , T. Emoto، نويسنده , , H. Tajiri، نويسنده , , T. Takahashi، نويسنده , , H. Sugiyama، نويسنده , , X. Zhang، نويسنده , , H. Kawata، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
5
From page
356
To page
360
Abstract
Surface structure of 6H-SiC(0 0 0 1)3×3 reconstruction has been studied by grazing incidence X-ray diffraction with synchrotron radiation. We compared the Patterson map obtained from experimental structure factors with calculated Patterson maps estimated from the models that had been proposed. As the result, the calculated Patterson maps of Kulakov et al.’s [Surf. Sci. 346 (1996) 49] and Starke and coworkers’ models [Phys. Rev. Lett. 80 (1998) 758; Phys. Rev. B 58 (1998) 10806; Surf. Rev. Lett. 6 (1999) 1129; Appl. Surf. Sci. 162–163 (2000) 9; Phys. Rev. B 62 (2000) 10335] are relatively in good agreement with experimental one. Therefore, we conclude that there is high possibility that either Kulakov et al.’s or Starke and coworkers’ models are reasonable as the actual 3×3 structure.
Keywords
X-ray diffraction , Reconstructed structure , SiC
Journal title
Applied Surface Science
Serial Year
2003
Journal title
Applied Surface Science
Record number
998775
Link To Document