• Title of article

    Structural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction

  • Author/Authors

    T. Aoyama ، نويسنده , , K. Akimoto *، نويسنده , , A. Ichimiya، نويسنده , , Y. Hisada ، نويسنده , , S. Mukainakano، نويسنده , , T. Emoto، نويسنده , , H. Tajiri، نويسنده , , T. Takahashi، نويسنده , , H. Sugiyama، نويسنده , , X. Zhang، نويسنده , , H. Kawata، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    5
  • From page
    356
  • To page
    360
  • Abstract
    Surface structure of 6H-SiC(0 0 0 1)3×3 reconstruction has been studied by grazing incidence X-ray diffraction with synchrotron radiation. We compared the Patterson map obtained from experimental structure factors with calculated Patterson maps estimated from the models that had been proposed. As the result, the calculated Patterson maps of Kulakov et al.’s [Surf. Sci. 346 (1996) 49] and Starke and coworkers’ models [Phys. Rev. Lett. 80 (1998) 758; Phys. Rev. B 58 (1998) 10806; Surf. Rev. Lett. 6 (1999) 1129; Appl. Surf. Sci. 162–163 (2000) 9; Phys. Rev. B 62 (2000) 10335] are relatively in good agreement with experimental one. Therefore, we conclude that there is high possibility that either Kulakov et al.’s or Starke and coworkers’ models are reasonable as the actual 3×3 structure.
  • Keywords
    X-ray diffraction , Reconstructed structure , SiC
  • Journal title
    Applied Surface Science
  • Serial Year
    2003
  • Journal title
    Applied Surface Science
  • Record number

    998775