Title of article :
Local atomic structure in Czochralski-grown
Ge1 xSix bulk alloys
Author/Authors :
I. Yonenaga*، نويسنده , , M. Sakurai، نويسنده , , M.H.F. Sluiter، نويسنده , , Y. Kawazoe، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
We investigated the local atomic structure in GeSi alloy experimentally and theoretically. Extended X-ray absorption fine
structure measurements in Czochralski-grown Ge1 xSix bulk alloys showed that the Ge–Ge and Ge–Si bond lengths maintain
distinctly different lengths and vary linearly with alloy composition across the whole composition range 0 < x < 1. This is in
good agreement with the expectation derived from ab initio electronic structure calculations. The result indicates that the bond
lengths and bond angles are distorted with alloy composition in GeSi.
# 2003 Elsevier B.V. All rights reserved
Keywords :
Bond length , Bond angle , Bulk alloy , Silicon–germanium , Germanium–silicon , Extended X-ray absorption fine structure
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science