Title of article :
Local atomic structure in Czochralski-grown Ge1 xSix bulk alloys
Author/Authors :
I. Yonenaga*، نويسنده , , M. Sakurai، نويسنده , , M.H.F. Sluiter، نويسنده , , Y. Kawazoe، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
4
From page :
193
To page :
196
Abstract :
We investigated the local atomic structure in GeSi alloy experimentally and theoretically. Extended X-ray absorption fine structure measurements in Czochralski-grown Ge1 xSix bulk alloys showed that the Ge–Ge and Ge–Si bond lengths maintain distinctly different lengths and vary linearly with alloy composition across the whole composition range 0 < x < 1. This is in good agreement with the expectation derived from ab initio electronic structure calculations. The result indicates that the bond lengths and bond angles are distorted with alloy composition in GeSi. # 2003 Elsevier B.V. All rights reserved
Keywords :
Bond length , Bond angle , Bulk alloy , Silicon–germanium , Germanium–silicon , Extended X-ray absorption fine structure
Journal title :
Applied Surface Science
Serial Year :
2004
Journal title :
Applied Surface Science
Record number :
999187
Link To Document :
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