Title of article :
Proposal of a multi-layer channel MOSFET: the application
of selective etching for Si/SiGe stacked layers
Author/Authors :
D. Sasaki، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
A multi-layer channel MOSFET (ML-MOSFET) and its fabrication process were proposed for future CMOS application.
ML-MOSFET has multi-Si channel layers stacked vertically, so that the drain current per 1 mm gate width on wafer is expected
to increase with the number of channel layers compared to conventional double-gate MOSFET. Ion ¼ 3:9 mA/mm was obtained
for ML-MOSFET with three Si channel layers (Lg: 10 nm, TSi: 2.5 nm) by the device simulation. Fabrication process of multilayer
channel using selective etching for SiGe/Si stacked layers was also investigated.
# 2003 Published by Elsevier B.V.
Keywords :
MOSFET , Double gate , Current drivability , SiGe selective etching , three-dimensional structure , Multi-layer channel
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science