Abstract :
Energy thresholds of electron stimulated desorption (ESD) for thin NaCl layers relative to the target current onset are
measured. The applied procedure allows to correct electron beam energy for the contact potential difference in the system. The
measured threshold energies are about 16.8 and 21 eV for Clþ. For Naþ, Na and Cl the threshold energies are about 8.4 and
16.8 eV. The value of 8.4 eV coincides with the fundamental absorption edge and confirms the so-called ‘‘defect-mediated
desorption’’ model of ESD. Basing on the experimental fact that the fundamental absorption edge appears to be a common
threshold for different particles it is suggested that the near surface lattice instabilities induced by electronic transitions may
result in a direct ejection of the constituents as well. The 16.8 eV threshold for Clþ confirms the involvement of an Auger
transition in positive halogen ion emission. The 21 eV threshold is assigned to the shake-up/shake-off processes.
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