Title of article :
Polycrystalline wafers of silicalite-1 etched by HF acid and viewed by SEM
Author/Authors :
L. Brabec*، نويسنده , , M. Koc?ir??´k، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
4
From page :
1
To page :
4
Abstract :
HF etching of polycrystalline silicalite-1 wafers enables to visualize grain boundaries of non-calcined crystals by dissolution of a phase between individual crystals as well as to reveal resistant shells of calcined crystals by dissolution of a crystal bulk. # 2004 Elsevier B.V. All rights reserved
Keywords :
Carbon residue , HF etching , Grain boundaries visualization
Journal title :
Applied Surface Science
Serial Year :
2004
Journal title :
Applied Surface Science
Record number :
999393
Link To Document :
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