Title of article
Polycrystalline wafers of silicalite-1 etched by HF acid and viewed by SEM
Author/Authors
L. Brabec*، نويسنده , , M. Koc?ir??´k، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
4
From page
1
To page
4
Abstract
HF etching of polycrystalline silicalite-1 wafers enables to visualize grain boundaries of non-calcined crystals by dissolution
of a phase between individual crystals as well as to reveal resistant shells of calcined crystals by dissolution of a crystal bulk.
# 2004 Elsevier B.V. All rights reserved
Keywords
Carbon residue , HF etching , Grain boundaries visualization
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
999393
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