Title of article :
Kinetics of bulk point defects in the growth of
nanocavities in crystalline Ge
Author/Authors :
S.H. Lee and J.C. Kim ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
Nanocavities created in Ge(111) by 5 keV Xe ion irradiation are characterized by ex situ transmission electron microscopy
(TEM). Nanocavities with average diameter of 10 nm are observed at 500 8C, while nanocavities with average diameter of 2.9 nm
are observed at 400 8C. The nanocavities grow beyond equilibrium size at 500 8C mainly due to absorption of vacancies produced
during 5 keV Xe ion irradiation. The sink strengths of the nanocavities and the Ge surface for absorption of interstitials and
vacancies are examined to elucidate the growth of the nanocavities in the absence of apparent biased sinks such as dislocations.
# 2004 Elsevier B.V. All rights reserved
Keywords :
Nanocavity , TRANSMISSION ELECTRON MICROSCOPY , Sink strength , Vacancy , interstitial
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science