Title of article :
Alumina-supported vanadyl phosphates catalysts for the oxidative dehydrogenation of ethane: an XPS characterisation
Author/Authors :
M.P. Casaletto، نويسنده , , G. Mattogno، نويسنده , , M.A. Massucci، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
11
From page :
216
To page :
226
Abstract :
Alumina-supported vanadyl phosphates were investigated by X-ray photoelectron spectroscopy (XPS) and compared with respect to thermal treatments and catalytic runs in the oxidative dehydrogenation of ethane. The surface chemical composition of the samples and the modifications induced by different temperatures of calcination and catalysis were determined. XPS characterization was done after calcination in air at T=550 and 650 °C and after catalytic activity tests at T=450 and 550 °C. The oxidation state, surface distribution and evolution of vanadium species were analyzed by the V 2p3/2 peak-fitting procedure. The surface concentration of different vanadium species was determined by XPS quantitative analysis. UV-Vis diffuse reflectance (UV-Vis DRS) and electron spin resonance (ESR) spectroscopies, which are very sensitive to the oxidation state and environment symmetry of vanadium, were also used for a detailed characterization of the samples.
Keywords :
XPS , Vanadium phosphate catalyst , Vanadium oxidation state , Oxidative dehydrogenation of ethane
Journal title :
Applied Surface Science
Serial Year :
2003
Journal title :
Applied Surface Science
Record number :
999958
Link To Document :
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