Title of article :
Preoxidation of the Cu layer in direct bonding technology
Author/Authors :
Honglong Ning، نويسنده , , Jusheng Ma، نويسنده , , Fuxiang Huang، نويسنده , , Yonggang Wang، نويسنده , , Qianqian Li، نويسنده , , Xiaoyan Li، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
9
From page :
250
To page :
258
Abstract :
Between the metal melting point and the eutectic temperature of the metal–oxygen, direct bonded copper (DBC) depends on the eutectic composition to join the copper and ceramic. The key of this technology is to import the oxygen to the bonding surface. In this paper, we do some research on the preoxidation law of the copper layer in direct bonding technology, so we can optimize the rang of preoxidation temperature and time. After we investigate the phase diagram of copper–oxygen, by the “conservation of mass” and “level principle”, we find there are some relationship between the preoxidation condition and the bonding process, and we offer a experiential formula to help control the bonding process. Finally, we also analyze the interface reaction production between the Cu layer and alumina ceramic, and discuss some possible reasons.
Keywords :
Preoxidation , Direct bonded copper (DBC) , Interface , Oxidation film
Journal title :
Applied Surface Science
Serial Year :
2003
Journal title :
Applied Surface Science
Record number :
999962
Link To Document :
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