11204

Tools and Techniques for Evaluating Reliability Trade-offs for Nano-Architectures

Binoy Ravindran استاد مشاور , Dong S. Ha استاد مشاور , Sandeep K. Shukla استاد راهنما

Virginia Polytechnic Institute and state University

نامعلوم

Master of Science )Electrical and Computer Engineering(

0

2004

Reliability , prism , granularity , entropy , probabilistic model checking , interconnect noise , MODELING , defect-tolerant architecture , Gaussian , NANOTECHNOLOGY , TMR , CTMR , Gibbs distribution

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انگليسي