• DocumentCode
    11408
  • Title

    Residual Stress Effects on Power Slump and Wafer Breakage in GaAs MESFETs

  • Author

    Robert W. Hendricks استاد راهنما , Aicha Elshabini-Riad استاد مشاور , Avraham Amith استاد مشاور

  • University
    Virginia Polytechnic Institute and state University
  • Grade
    نامعلوم
  • Major
    PhD )Materials Science and Engineering(
  • Number of pages
    0
  • Publish Date
    1996
  • Keyword

    semiconductor device , X-ray diffraction , STRESS , Gallium arsenide , MESFET , wafer breakage

  • Note
    01
  • Language
    انگليسي
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=17&DC=11408