DocumentCode :
14138
Title :
Experimental Study of Scan Based Transition Fault Testing Techniques
Author :
James M. Baker استاد مشاور , Michael S. Hsiao استاد راهنما , Sandeep K. Shukla استاد مشاور
University :
Virginia Polytechnic Institute and state University
Grade :
نامعلوم
Major :
Master of Science )Electrical and Computer Engineering(
Number of pages :
0
Publish Date :
2003
Keyword :
broad-side , ATPG , test coverage , skewed load , pattern volume , Transition Faults
Note :
01
Language :
انگليسي
Link To Document :
بازگشت