Title :
Experimental Study of Scan Based Transition Fault Testing Techniques
Author :
James M. Baker استاد مشاور , Michael S. Hsiao استاد راهنما , Sandeep K. Shukla استاد مشاور
University :
Virginia Polytechnic Institute and state University
Major :
Master of Science )Electrical and Computer Engineering(
Keyword :
broad-side , ATPG , test coverage , skewed load , pattern volume , Transition Faults
