• DocumentCode
    22922
  • Title

    On Chip Characterization of Single Event Transient Pulse Widths

  • Author

    Ronald D. Schrimpf استاد راهنما , Bharat L. Bhuva استاد مشاور

  • University
    Vanderbilt University
  • Grade
    نامعلوم
  • Major
    Master of Science )Electrical Engineering(
  • Number of pages
    0
  • Publish Date
    2005
  • Keyword

    CMOS , single event , set , transient pulse width , RHBD , SEU

  • Note
    01
  • Language
    انگليسي