DocumentCode :
23990
Title :
Programmable latching probe microstructures for wafer testing applications
Author :
Cornely Roy H. استاد مشاور , Carr William N. استاد راهنما
University :
Van Houten Library )new Jersey Institute Of Technology(
Grade :
نامعلوم
Major :
Master of Science )Department of Electrical and Computer Engineering(
Number of pages :
0
Publish Date :
2000
Keyword :
Micro Electromechanical systems )MEMS( , Programmable wafer testing array
Note :
01
Language :
انگليسي
Link To Document :
بازگشت