DocumentCode
3435
Title
Characterization of ultrathin gate dielectrics and multilayer charge injection barriers
Author
Chin Ken K. استاد راهنما , Tompa Gary S. استاد مشاور
University
Van Houten Library )new Jersey Institute Of Technology(
Grade
دكتري
Major
Doctor of Philosophy )Applied Physics(
Number of pages
0
Publish Date
2004
Keyword
Nonvolatile memory , Gate dialectrics , Ultrathin oxide , Oxide degradation , Layered tunnel barrier , Electron tunneling
Note
01
Language
انگليسي
Link To Document