DocumentCode :
3998
Title :
Efficient Alternate Test Generation for RF Transceiver Architectures
Author :
John Papapolymerou استاد مشاور , Abhijit Chatterjee استاد راهنما , David Keezer استاد مشاور
University :
Georgia Institute Of Technology
Grade :
دكتري
Major :
Doctor of Philosophy
Number of pages :
0
Publish Date :
2006
Keyword :
Wireless test , Alternate test , RF test , Wireless transceiver , Production test , System-level test
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=3998