DocumentCode
4416
Title
Radiative properties of silicon wafers with microroughness and thin-film coatings
Author
Zhang Zhuomin M. استاد راهنما , Gallivan Martha استاد مشاور
University
Georgia Institute Of Technology
Grade
دكتري
Major
Doctor of Philosophy
Number of pages
0
Publish Date
2006
Keyword
Silicon , anisotropic roughness , ray-tracing method , Rough surface , radiative property , BRDF
Note
01
Language
انگليسي
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