DocumentCode
492
Title
In- and Ex-Situ Analysis of Silicon Oxide, Silicon Oxynitride, and Silicon Nitride Interfaces by Second Harmonic Generation and Correlation with Other Linear Optical Techniques
Author
Gerald Lucovsky استاد مشاور , John E. Rowe استاد مشاور , Robert M. Kolbas استاد مشاور , David E. Aspnes استاد راهنما
University
Raleigh North carolina state university
Grade
نامعلوم
Major
PhD )Physics(
Number of pages
0
Publish Date
2000
Note
01
Language
انگليسي
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