DocumentCode :
4951
Title :
Probe Modules For Wafer-Level Testing Of Gigascale Chips With Electrical And Optical I/O Interconnects
Author :
Gaylord Thomas K. استاد مشاور , Meindl James D. استاد راهنما , Callen William استاد مشاور
University :
Georgia University Of Technology
Grade :
دكتري
Major :
Doctor of Philosophy
Number of pages :
0
Publish Date :
2006
Keyword :
optical loopback , probe , optoelectronic testing , Optical testing , waveguide , MOEMS , compliant leads , optical interconnects , Packaging , interconnects , through-wafer interconnects , MEMS
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=4951
