DocumentCode
5384
Title
X-ray absorption fine structure strain determination in thin films
Author
R. W. Hoffman استاد راهنما
University
OhioLINK ETD
Grade
دكتري
Major
Doctor of Philosophy )Case Western Reserve University, Physics(
Number of pages
0
Publish Date
1992
Keyword
X-ray absorption fine structure )XAFS( , Thin films
Note
01
Language
انگليسي
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