DocumentCode
5595
Title
Microstructural investigation of defects in epitaxial GaAs grown on mismatched Ge and SiGe/Si substrates
Author
Steven A. Ringel استاد راهنما
University
OhioLINK ETD
Grade
دكتري
Major
Doctor of Philosophy )Ohio State University, Electrical Engineering(
Number of pages
0
Publish Date
2005
Keyword
Transmission electron microscopy , TEM , Molecular Beam Epitaxy , metal organic chemical vapor deposition , electron beam induced current , EBIC , Defects , MOCVD , MBE
Note
01
Language
انگليسي
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