DocumentCode :
566
Title :
Charaterization of the Growth of Aluminum Nitride and Gallium Nitride Thin Films on Hydrogen Etched and / or cleaned 6 H-Sic 0001 Surfaces
Author :
Robert F. Davis استاد راهنما
University :
Raleigh Nort Carolina state university
Grade :
دكتري
Major :
Doctor of Eduation )Material Science and Engineering(
Number of pages :
0
Publish Date :
2000
Note :
01
Language :
انگليسي
Link To Document :
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