Behavior of Optical Parameters of CuZnSnO4Thin Films

A compound (CuZnSnO4) as thin films is deposited by thermal evaporation method at room temperature onto glass substrates at film thicknesses (100 300) nm. The structure of CuZnSnO4films is amorphous as indicated by X-ray diffraction pattern. Optical parameters like, transmittance, energy gap, constants of direct transition, Urbach energy, refractive index, extinction coefficient, and complex dielectric constant are studied. A good property for this compound, it can be used as window layer or absorbance layer with the variation of film thickness.