Low Power, and Highly Reliable Single Event Upset Immune Latch for Nanoscale CMOS Technologies

پديدآورندگان

Ramin Rajaei ,

كليدواژه

latch , single event upset (SEU) , radiation hardening , soft errors , SEU immunity , low power design

كشور

ايران

نويسنده

Abdolah Amirany

كلمات كليدي

latch, single event upset (SEU), radiation hardening, soft errors, SEU immunity, low power design

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