پديدآورندگان :
Ghaffarpour Jahromi Saeed y_dehghan_b@yahoo.com Shahid Rajaee Teacher Training , Dehghan Banadaky yasaman Master Student in Geotechnic, Shahid Rajaee Teacher Training
كليدواژه :
AFM , XRD , SEM , FT , IR , XRF , GC , MS , TEM , TGA , AA , Nano , clays , Nano , Particles , nanotechnology , nanotubes.
چكيده فارسي :
In order for analyzing the Nano particles area and details of materials in Nano Scale, there are used of different techniques such as AFM XRD / SEM / FT-IR / XRF / GC-MS / TEM / TGA / AA that are more applied in civil engineering. This study aims to introduce the application of such approaches, preparing the samples in each method, dealing with advantages and disadvantages of each method. In this paper, the images prepared in each approach have been completely illustrated.
