Author/Authors :
Jahanzeb Anwer Electrical & Electronics Engineering Department - Universiti Teknologi PETRONAS Bander Seri Iskander, Tronoh, Perak, Malaysia , Usman Khalid Electrical & Electronics Engineering Department - Universiti Teknologi PETRONAS Bander Seri Iskander, Tronoh, Perak, Malaysia , Narinderjit Singh Electrical & Electronics Engineering Department - Universiti Teknologi PETRONAS Bander Seri Iskander, Tronoh, Perak, Malaysia , Nor H Hamid Electrical & Electronics Engineering Department - Universiti Teknologi PETRONAS Bander Seri Iskander, Tronoh, Perak, Malaysia , Vijanth S Asirvadam Electrical & Electronics Engineering Department - Universiti Teknologi PETRONAS Bander Seri Iskander, Tronoh, Perak, Malaysia
چكيده لاتين :
The error-sensitivity of nanoscale circuits is an
extremely important issue in electronic industry these days. The
reason is the high susceptibility of electronic circuits to noise at
the nanoscale level. Markov Random Field (MRF) modelling is
one approach to achieve noise-tolerance in integrated circuit
design. In this paper, we have designed an error detection
mechanism for digital circuits based on Joint Probability
analysis of Markov random Field (MRF) networks. The circuit
and testbench design has been carried out in the software Xilinx
ISE 8.1i. Our error detection mechanism is an excellent solution
for digital system designs where space is not a critical factor but
reliability of system matters a lot.
