شماره ركورد كنفرانس :
3537
عنوان مقاله :
On the Reliability of Switching and Multivalued Networks
Author/Authors :
Ali Abbasinasab Dept. of Electrical and Computer Engineering University of Calgary, Calgary, Canada , S. N Yanushkevich Dept. of Electrical and Computer Engineering University of Calgary, Calgary, Canada
كليدواژه :
reliability analysis , probabilistic transfer matrices , multivalued logic , switching circuit
عنوان كنفرانس :
شانزدهمين همايش بين المللي معماري كامپيوتر و سيستم هاي ديجيتال
چكيده لاتين :
This paper investigates reliability of logic gates
and circuits based on probabilistic transfer matrices (PTM).
A probabilistic model for multivalued gates and networks is
developed through extending the concept of PTM. This paper
studies how the reliability of k-ary logic networks depends on
the radix k and the input and gate errors.
