شماره ركورد كنفرانس :
3704
عنوان مقاله :
يك مقايسه كننده جديد با سرعت نمونه برداري يك گيگا نمونه بر ثانيه و با دقت تشخيص 400 ميكروولت و با توان مصرفي نسبتا خوب
عنوان به زبان ديگر :
A New 1GS/s Sampling Rate and 400µV Resolution with Reliable Power Consumption Dynamic Latched Type Comparator
پديدآورندگان :
Mahdavi Sina mahdavi9099@yahoo.com Young Researchers and Elite Club, Tabriz Branch, Islamic Azad University, Tabriz, Iran; , Poore Maryam m.m.poreh@urumi.ac.ir Department of Microelectronics Engineering, Urmia Graduate Institute, Urmia, Iran; , Atai Shadi m.s.ataei@urumi.ac.ir Department of Microelectronics Engineering, Urmia Graduate Institute, Urmia, Iran; , Jafarzadeh Mahsa m.m.jafarzadeh@urumi.ac.ir Department of Microelectronics Engineering, Urmia Graduate Institute, Urmia, Iran; , Noroozpoor Faize m.f.noruzpur@urumi.ac.ir Department of Microelectronics Engineering, Urmia Graduate Institute, Urmia, Iran;
كليدواژه :
دقت بالا , سرعت بالا , مقايسه كننده , مبدل آنالوگ به ديجيتال
عنوان كنفرانس :
پنجمين كنفرانس بين المللي در مهندسي برق و كامپيوتر با تاكيد بر دانش بومي
چكيده فارسي :
A new high-speed dynamic latched type comparator with reliable resolution is presented in this paper. The proposed paper presents a 1GS/s sampling rate in presence of 5mV input offset, and it can detect the very low voltage differences such as ±200µV at the output nodes, reliably. The power consumption and delay time of the proposed circuit are 750µw and 257ps with the power supply of 1.8V, respectively. Furthermore, the proposed structure is the suitable candidate for high-speed SAR ADC, as well. Monte Carlo simulation using Virtuoso® Spectre shows that the comparator has suitable resolution when working at 1GHz. The active area of the proposed circuit is 613.73µm2. Simulation results of the suggested circuit are performed using the BSIM3 model of a 0.18µm CMOS process with the power supply of 1.8 volts at all process corners along with the different temperatures in the region -50℃ to +50℃, reliably.
چكيده لاتين :
A new high-speed dynamic latched type comparator with reliable resolution is presented in this paper. The proposed paper presents a 1GS/s sampling rate in presence of 5mV input offset, and it can detect the very low voltage differences such as ±200µV at the output nodes, reliably. The power consumption and delay time of the proposed circuit are 750µw and 257ps with the power supply of 1.8V, respectively. Furthermore, the proposed structure is the suitable candidate for high-speed SAR ADC, as well. Monte Carlo simulation using Virtuoso® Spectre shows that the comparator has suitable resolution when working at 1GHz. The active area of the proposed circuit is 613.73µm2. Simulation results of the suggested circuit are performed using the BSIM3 model of a 0.18µm CMOS process with the power supply of 1.8 volts at all process corners along with the different temperatures in the region -50℃ to +50℃, reliably.
