On the study of a new suggested censoring plan: Extension of first failure censoring

In this paper, a new censoring scheme called m-th failure censoring, is introduced for reducing cost and total time on test. Maximum likelihood (ML) estimate for the parameter of the exponential distribution is discussed based on data coming from the suggested scheme. The distribution of ML estimator as well as the expected total time on test based on the m-th failure censored sample are derived. Finally, an explicit expression for the expected test time on the basis of the proposed censoring scheme is discussed.